Author: Dallin, L.O.
Paper Title Page
Review of Source Size Measurement Techniques for Low-Emittance Synchrotron Sources  
  • N. Samadi
    University of Saskatchewan, Saskatoon, Canada
  • L.D. Chapman, L.O. Dallin
    CLS, Saskatoon, Saskatchewan, Canada
  • N. Samadi
    PSI, Villigen PSI, Switzerland
  • X. Shi
    ANL, Lemont, Illinois, USA
  Three radiation-based techniques - pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor (ps-BPM) system - are studied in detail for measuring small electron source sizes at low-emittance light sources. Each method has its advantages and limitations and provides complementary information. Pinhole imaging is the most commonly used technique which has the simplest setup but with limited resolution. Double-slit interferometry gives the highest sensitivity among the three methods. The ps-BPM system has a reasonable resolution in measuring source size and divergence, and at the same time, provides real-time information on source position and angle. A combination of multiple techniques is recommended for the full characterization of the source  
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